Characterization and mapping of leaf rust resistance in four durum wheat cultivars
نویسندگان
چکیده
منابع مشابه
Molecular Mapping of Wheat Leaf Rust Resistance Gene Lr42
Leaf rust, caused by Puccinia triticina Eriks., is an important foliar disease of wheat (Triticum aestivum L.) worldwide. Leaf rust resistance gene Lr42 from Aegilops tauschii Coss. has been used as a source of rust resistance in breeding programs. To identify molecular markers closely linked to Lr42, a segregating population of nearisogenic lines contrasting for the presence of Lr42 was develo...
متن کاملGenome-Wide Association Mapping of Leaf Rust Response in a Durum Wheat Worldwide Germplasm Collection.
Leaf rust (caused by Erikss. []) is increasingly impacting durum wheat ( L. var. ) production with the recent appearance of races with virulence to widely grown cultivars in many durum producing areas worldwide. A highly virulent race on durum wheat was recently detected in Kansas. This race may spread to the northern Great Plains, where most of the US durum wheat is produced. The objective of ...
متن کاملGenetics of leaf rust resistance in spring wheat cultivars alsen and norm.
ABSTRACT Alsen is a recently released spring wheat cultivar that has been widely grown in the United States because it has resistance to Fusarium head blight and leaf rust caused by Puccinia triticina. Norm is a high yielding wheat cultivar that has been very resistant to leaf rust since it was released. Alsen and Norm were genetically examined to determine the number and identity of the leaf r...
متن کاملEvaluation of Levels of Non-hypersensitive Resistance in Different Spring Wheat Cultivars to Leaf Rust
Levels and components of non-hypersensitive resistance in wheat (Triticum aestivum L.) to leaf rust (Puccinia triticina) were studied at seedling and adult plant stage in green house and field conditions during 2001 at Wageningen University, The Netherlands. In seedling stage, level of non-hypersensitive resistance or partial resistance was assessed from latency period (LP), infection frequency...
متن کاملIdentification of Leaf Rust Resistance Genes in Selected Egyptian Wheat Cultivars by Molecular Markers
Leaf rust, caused by Puccinia triticina Eriks., is a common and widespread disease of wheat (Triticum aestivum L.) in Egypt. Host resistance is the most economical, effective, and ecologically sustainable method of controlling the disease. Molecular markers help to determine leaf rust resistance genes (Lr genes). The objective of this study was to identify Lr genes in fifteen wheat cultivars fr...
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ژورنال
عنوان ژورنال: PLOS ONE
سال: 2018
ISSN: 1932-6203
DOI: 10.1371/journal.pone.0197317